Advances in X-Ray Analysis: Volume 37 by Ron Jenkins (auth.), John V. Gilfrich, Ting C. Huang, I.

By Ron Jenkins (auth.), John V. Gilfrich, Ting C. Huang, I. Cev Noyan, Paul K. Predecki, Charles C. Goldsmith, Ron Jenkins, Deane K. Smith (eds.)

89 articles prepared lower than the next part heads: impression of pcs on Xray research. purposes of entire trend becoming: constitution decision, section id, Lattice Parameters. Search/Match equipment, part identity. Diffraction from unmarried Crystals and Epitaxial movies. Xray Characterization of movies and floor Layers. pressure and rigidity choice, Xray Fractography, Diffraction height Broadening research. Advances in Detectors and Counting Electronics. XRD innovations and Instrumentation, Nonambient functions, Texture, different purposes. Xray Optics, Monochromators and artificial Multilayers. overall mirrored image XRF purposes and Instrumentation, different XRF ideas and Instrumentation. Mathematical suggestions in Xray Spectrometry. Geological and different functions of XRS. Index.

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Wc . fA_ 't(A)·I(A)·dJ... I I Sj I I j JAo Il(A) + Il(i) sin

Parrish: Advances in X-Ray Analysis 29,395 (1986) 19. Borstrok, A. Brouwer: X-Ray Spectrom 22, 33 (1993) 20. Grasserbauer: Habilitationsschrift, University of Technology, Vienna (1973) 21. Sohmura: Advances in X-Ray Analysis 26, 423 (1983) 22. Straub: Thin Solid Films 157,325 (1988) 23. Kaufmann: Advances in X-Ray Analysis 37 (submitted) THE USE OF PCs FOR AB INITIO STRUCTURE DETERMINATION FROM POWDER DIFFRACTION DATA Michele Louer and Daniel Louer Laboratoire de Cristallochimie (URA CNRS 1495), Universite de Rennes A venue du General Leclerc, 35042 Rennes cedex, France INTRODUCTION The determination ab initio of crystal structures from powder diffraction data has been the most striking advance of modern powder crystallography 1.

Smith and S. Gorter (3-5). REFERENCES 1. PC Magazine, (1988) cited July 1993 page 550. 2. , PA. 3. K. Smith, "Computer Analysis of Diffraction Data", Rev. Mineralogy, 20:183 (1989). 4. K. Smith and S. Gorter, "Powder Diffraction Program Information 1990 Program List" J. Aggl. Ctyst. 24:369 (1991). 5. S. K. 11", in press (1993). SOFTWARE FOR XRF Michael Mantler Institute of Applied and Technical Physics University of Technology, Vienna, Austria 1. INTRODUCTION As in other fields of spectroscopy, software for x-ray fluorescent analysis has to assist the user in instrument control, raw data refinement, qualitative interpretation of spectral data, and computations for obtaining quantitative results.

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